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1
Identification and Compensation of Dynamic Scale Mismatches in High-Speed End Mill Boring Trajectory on CNC Machines
Identification and Compensation of Dynamic Scale Mismatches in High-Speed End Mill Boring Trajectory on CNC Machines
Slamani, M / Slamani, M / 2010

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2
Development of Plasma Nanomanufacturing Workcell
Development of Plasma Nanomanufacturing Workcell
Lai, K.W.C / Lai, K.W.C / 2010

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Naver
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3
High Frequency Correction of Dynamometer for Cutting Force Observation in Milling
High Frequency Correction of Dynamometer for Cutting Force Observation in Milling
Girardin, F / Girardin, F / 2010

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Naver
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4
Modeling of Recast Layer in Micro-Electrical Discharge Machining
Modeling of Recast Layer in Micro-Electrical Discharge Machining
Tan, P.C / Tan, P.C / 2010

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Naver
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5
Process Robustness of Hot Embossing Microfluidic Devices
Process Robustness of Hot Embossing Microfluidic Devices
Eusner, T / Eusner, T / 2010

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Naver
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6
Assessment of Microbial Biofilm Growth on Nanocrystalline Diamond in a Continuous Perfusion Environment
Assessment of Microbial Biofilm Growth on Nanocrystalline Diamond in a Continuous Perfusion Environment
Lewis, J.S / Lewis, J.S / 2010

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Naver
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7
Integrated Sustainability Analysis of Atomic Layer Deposition for Microelectronics Manufacturing
Integrated Sustainability Analysis of Atomic Layer Deposition for Microelectronics Manufacturing
Yuan, C.Y / Yuan, C.Y / 2010

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8
Emerging Challenges of Microactuators for Nanoscale Positioning, Assembly, and Manipulation
Emerging Challenges of Microactuators for Nanoscale Positioning, Assembly, and Manipulation
Sahu, B / Sahu, B / 2010

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9
Probe-Tip Induced Damage in Compliant Substrates
Probe-Tip Induced Damage in Compliant Substrates
Chandross, M / Chandross, M / 2010

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10
Pulse Breakdown in Sub-20 nm Organic Dielectrics for Nanoscale-Electromachining (nano-EM)
Pulse Breakdown in Sub-20 nm Organic Dielectrics for Nanoscale-Electromachining (nano-EM)
Virwani, K.R / Virwani, K.R / 2010

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Naver
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