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Rohu託Op!imalControl ofRobot Manipulatorn with aW e1ghtmg Matrix Detenmination Algoritl1m
Rohu託Op!imalControl ofRobot Manipulatorn with aW e1ghtmg Matrix Detenmination Algoritl1m
Mi-KyungK1mandHee-JunKang / Mi-KyungK1mandHee-JunKang / 2004

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2
User-fnendly Automa!ic Polishing Robot System and Its Integrated Operating Program
User-fnendly Automa!ic Polishing Robot System and Its Integrated Operating Program
Mm-Ch出olLee,Jin同YoungJung and Seok-Jo Go / Mm-Ch出olLee,Jin同YoungJung and Seok-Jo Go / 2004

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3
Experimental Venfication on the Corrective Machining AlgorithmおrImproving也eMotion Accuracy ofHydrostatic earing Tables
Experimental Venfication on the Corrective Machining AlgorithmおrImproving也eMotion Accuracy ofHydrostatic earing Tables
Chun Hong Park, Chan Hong Lee and Husang Lee / Chun Hong Park, Chan Hong Lee and Husang Lee / 2004

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4
Develo伊国ntof aふaxisrohols finger force/moment sensor自brstablegr田pingof an uniα10wnob1ect
Develo伊国ntof aふaxisrohols finger force/moment sensor自brstablegr田pingof an uniα10wnob1ect
Gab-Soon Ki / Gab-Soon Ki / 2004

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5
V ib悶iton Analysis of aRo tary Comp氏自or
V ib悶iton Analysis of aRo tary Comp氏自or
Hyung-Suk Han, Sean-Woong Hwang and Jeong-Seo Koo / Hyung-Suk Han, Sean-Woong Hwang and Jeong-Seo Koo / 2004

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6
Machining Characteristics of Cemented Carbides in Micro Cuttmg withm SEM
Machining Characteristics of Cemented Carbides in Micro Cuttmg withm SEM
Sung-Jung Heo / Sung-Jung Heo / 2004

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7
S1mula!ion of Vehicle Steenng C叩trolthrough Differential Braking
S1mula!ion of Vehicle Steenng C叩trolthrough Differential Braking
Bong・心hoon Jang, Yeo-Heung Yun and Seong-Cheol Lee / Bong・心hoon Jang, Yeo-Heung Yun and Seong-Cheol Lee / 2004

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8
PitchM田surementof 150 mn ID grating Standards Using an Nano-me位。logicalAtomic Force Microscope
PitchM田surementof 150 mn ID grating Standards Using an Nano-me位。logicalAtomic Force Microscope
Jonghan Jin, Jchiko Misumi, Satoshi Gonda and Tom / Jonghan Jin, Jchiko Misumi, Satoshi Gonda and Tom / 2004

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9
Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages
Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages
・Jae-Yeo! Kim, Sung-Un Yoon and Chang-H四nKim / ・Jae-Yeo! Kim, Sung-Un Yoon and Chang-H四nKim / 2004

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10
Effects of Contact Conditions on the Connector Electrical Resistance nfDirect Current Ci四Ill包
Effects of Contact Conditions on the Connector Electrical Resistance nfDirect Current Ci四Ill包
・・Y o ung-Tae Kim, Jn Ha Sung, Jin-San Kim and Da / ・・Y o ung-Tae Kim, Jn Ha Sung, Jin-San Kim and Da / 2004

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