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321
부유물질 측정방법의 종류와 특성(Types and Characteristics of Suspended Solids Measurement)
부유물질 측정방법의 종류와 특성(Types and Characteristics of Suspended Solids Measurement)
김용기(Yong-Ki Kim) / 김용기(Yong-Ki Kim) / 2003

종합자료실 / 대출가능
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322
지상강좌(Lectures in Magazine) : 성분 검출기(Components Detector)
지상강좌(Lectures in Magazine) : 성분 검출기(Components Detector)
김동화(Dong-Hwa Kim) / 김동화(Dong-Hwa Kim) / 2003

종합자료실 / 대출가능
Naver
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323
매사추세츠 공과 대학의 I＆C 엔지니어링(I＆C Engineering of Massachusetts Institute of Technology)
매사추세츠 공과 대학의 I＆C 엔지니어링(I＆C Engineering of Massachusetts Institute of Technology)
김영권(Young-Gwon Kim) / 김영권(Young-Gwon Kim) / 2003

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Naver
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324
전동차량용 필드버스 기술 동향(Technical Trends of Fieldbus for Electromotive vehicles)
전동차량용 필드버스 기술 동향(Technical Trends of Fieldbus for Electromotive vehicles)
최명호(Myung-Ho Kim) / 최명호(Myung-Ho Kim) / 2003

종합자료실 / 대출가능
Naver
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325
산업용 이더넷과 INTERBUS 통신기술(Industrial Ethernet and Technology of communications on INTERBUS)
산업용 이더넷과 INTERBUS 통신기술(Industrial Ethernet and Technology of communications on INTERBUS)
김동언(Dong-Un Kim) / 김동언(Dong-Un Kim) / 2003

종합자료실 / 대출가능
Naver
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326
새로운 개념의 Remote I／O(New Conceptual Remote I／O)
새로운 개념의 Remote I／O(New Conceptual Remote I／O)
김정한(Jung-Han Kim) / 김정한(Jung-Han Kim) / 2003

종합자료실 / 대출가능
Naver
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327
필드버스를 이용한 자동제어 시스템(Automatic Control System using Fieldbus)
필드버스를 이용한 자동제어 시스템(Automatic Control System using Fieldbus)
김정훈(Jung-Hun Kim) / 김정훈(Jung-Hun Kim) / 2003

종합자료실 / 대출가능
Naver
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328
지상강좌(Lectures in Magazine) : 각종 유량계에 의한 유량 측정-Ⅱ(Flow Measurement using Varied Types of FlowMeter-Ⅱ)
지상강좌(Lectures in Magazine) : 각종 유량계에 의한 유량 측정-Ⅱ(Flow Measurement using Varied Types of FlowMeter-Ⅱ)
김동화(Dong-Hwa Kim) / 김동화(Dong-Hwa Kim) / 2003

종합자료실 / 대출가능
Naver
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329
RESISTIVITY 측정기술(Surveying Instrument of RESISTIVITY)
RESISTIVITY 측정기술(Surveying Instrument of RESISTIVITY)
김원제(Won-Je Kim) / 김원제(Won-Je Kim) / 2003

종합자료실 / 대출가능
Naver
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330
반도체 공정 플라즈마 모니터링 장치에 의한 생산성 향상(ImProvement of Productivity by Semiconductor Process Plasma Monitoring Device)
반도체 공정 플라즈마 모니터링 장치에 의한 생산성 향상(ImProvement of Productivity by Semiconductor Process Plasma Monitoring Device)
김영권(Young-Gwon Kim) / 김영권(Young-Gwon Kim) / 2003

종합자료실 / 대출가능
Naver
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