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Scanning Tunneling Microscopy and Its Applications
Scanning Tunneling Microscopy and Its Applications
Detailed Information
- 자료유형
- 단행본
- ISBN
- 3-540-65715-0
- UDC
- 53.082.7
- DDC
- 681.2 B152s-23
- 청구기호
- 681.2 B152s
- 저자명
- Bai, Chunli
- 서명/저자
- Scanning Tunneling Microscopy and Its Applications / Chunli Bai 저.
- 판사항
- 2판
- 발행사항
- 미국 : Springer-Verlag, 2000
- 형태사항
- 369p. ; 24cm
- 내용주기
- 완전내용1. Introduction부분내용1완전내용1.1 Advantages of STM Compared with Other Techniques부분내용1완전내용1.2 From Optical Microscopy to Scamming Tunneling Microscopy부분내용3완전내용1.3 Overview부분내용7완전내용2. The Tummeling Effect부분내용11완전내용2.1 Historical Remarks부분내용11완전내용2.2 Tunneling-Current Theory부분내용17완전내용2.3 Tip-Surface Interaction Model부분내용25완전내용3. Spectroscopy, and Spectroscopic Imaging부분내용37완전내용3.1 Concepts of Tunneling Spectroscopies부분내용3800완전내용3.2 Experimental Modes부분내용4211완전내용3.3 Energy Resolution부분내용4722완전내용3.4 Examples부분내용4933완전내용4. STM Instrumentation부분내용6344완전내용4.1 The Cobration Isolation Sytem부분내용6355완전내용4.2 Mechanical Designs부분내용6766완전내용4.3 Tip Preparation부분내용8077완전내용4.4 Electronics부분내용9288완전내용4.5 Computer Automation부분내용9699완전내용5. Other Related Scanning Probe Microscopes부분내용10500완전내용5.1 Atomic Force Microscope부분내용10511완전내용5.2 Other Scanning-Force MIcroscopies부분내용12122완전내용5.3 Ballistic-Electron-Emission Microscopy부분내용13333완전내용5.4 Scanning Ion-Conductance Microscope부분내용14544완전내용5.5 Scanning Thermal Microscope부분내용14755완전내용5.6 Scanning Tunneling Potentiometry and scanning Noise Microscopy부분내용14966완전내용5.7 Photon Scanning Tunneling Microscopy and Scanning Plasmon Near-Field Microscopy부분내용15177완전내용5.8 Near-Field Scanning Optical Microscopu and Spectroscopy부분내용15388완전내용6. STM Studies of Clean Surfaces부분내용16599완전내용6.1 Metal Surfaces부분내용16500완전내용6.2 Elenemtal Semiconductor Surfaces부분내용17311완전내용6.3 Compound Semiconductors and Layered Compounds부분내용18722완전내용7. Surface Adsorbates and Surface Chemistry부분내용20533완전내용7.1 Adsorption on Metal Surfaces부분내용20544완전내용7.2 Adsorption on Semiconductor Surfaces부분내용22955완전내용7.3 Molecules, and Molecular Adsorbates부분내용24266완전내용7.4 Obserbation of Clusters부분내용25777완전내용7.5 Nucleation and Growth부분내용26088완전내용7.6 Chemical Reactions on Metals부분내용26599완전내용7.7 Chemical Reaction on Semiconductors부분내용27100완전내용8. Biological Applications부분내용27911완전내용8.1 Avantages and Problems부분내용27922완전내용8.2 Preparation부분내용28233완전내용8.3 Nucleic Acids부분내용28744완전내용8.4 Proteins부분내용29655완전내용8.5 Biological Menbranes부분내용30166완전내용8.6 Imaging Cells and Other Applications부분내용30277완전내용8.7 Force Spectrum Analysis of Biologcal Materals부분내용30688완전내용9. Surface Modification부분내용30999완전내용9.1 Overview부분내용30900완전내용9.2 Direct Indentation with the Tunneling Tip부분내용31011완전내용9.3 Nanolithography on Resist Films부분내용32122완전내용9.4 Nanofabrication inSolution and in Gaseous Environments부분내용32433완전내용9.5 Atomic-Scale Manipulation부분내용32744완전내용9.6 Quantization of Conductance in Nano-Contacts Rroduced bt STM부분내용33855완전내용9.7 Fabrication With Other scanning-Probe Microscopes부분내용33966완전내용9.8 The Future부분내용34377완전내용References부분내용34588완전내용Subject Index부분내용36799
- 가격
- ￦92830
- Control Number
- gtec:8288
MARC
008021021s2000 us 000a eng■020 ▼a3-540-65715-0
■0801 ▼a53.082.7
■082 ▼a681.2▼bB152s▼223
■090 ▼a681.2▼bB152s
■1000 ▼aBai, Chunli
■24510▼aScanning Tunneling Microscopy and Its Applications▼dChunli Bai 저.
■250 ▼a2판
■260 ▼a미국▼bSpringer-Verlag▼c2000
■300 ▼a369p.▼c24cm
■505 ▼a1. Introduction▼c1▼a1.1 Advantages of STM Compared with Other Techniques▼c1▼a1.2 From Optical Microscopy to Scamming Tunneling Microscopy▼c3▼a1.3 Overview▼c7▼a2. The Tummeling Effect▼c11▼a2.1 Historical Remarks▼c11▼a2.2 Tunneling-Current Theory▼c17▼a2.3 Tip-Surface Interaction Model▼c25▼a3. Spectroscopy, and Spectroscopic Imaging▼c37▼a3.1 Concepts of Tunneling Spectroscopies▼c3800▼a3.2 Experimental Modes▼c4211▼a3.3 Energy Resolution▼c4722▼a3.4 Examples▼c4933▼a4. STM Instrumentation▼c6344▼a4.1 The Cobration Isolation Sytem▼c6355▼a4.2 Mechanical Designs▼c6766▼a4.3 Tip Preparation▼c8077▼a4.4 Electronics▼c9288▼a4.5 Computer Automation▼c9699▼a5. Other Related Scanning Probe Microscopes▼c10500▼a5.1 Atomic Force Microscope▼c10511▼a5.2 Other Scanning-Force MIcroscopies▼c12122▼a5.3 Ballistic-Electron-Emission Microscopy▼c13333▼a5.4 Scanning Ion-Conductance Microscope▼c14544▼a5.5 Scanning Thermal Microscope▼c14755▼a5.6 Scanning Tunneling Potentiometry and scanning Noise Microscopy▼c14966▼a5.7 Photon Scanning Tunneling Microscopy and Scanning Plasmon Near-Field Microscopy▼c15177▼a5.8 Near-Field Scanning Optical Microscopu and Spectroscopy▼c15388▼a6. STM Studies of Clean Surfaces▼c16599▼a6.1 Metal Surfaces▼c16500▼a6.2 Elenemtal Semiconductor Surfaces▼c17311▼a6.3 Compound Semiconductors and Layered Compounds▼c18722▼a7. Surface Adsorbates and Surface Chemistry▼c20533▼a7.1 Adsorption on Metal Surfaces▼c20544▼a7.2 Adsorption on Semiconductor Surfaces▼c22955▼a7.3 Molecules, and Molecular Adsorbates▼c24266▼a7.4 Obserbation of Clusters▼c25777▼a7.5 Nucleation and Growth▼c26088▼a7.6 Chemical Reactions on Metals▼c26599▼a7.7 Chemical Reaction on Semiconductors▼c27100▼a8. Biological Applications▼c27911▼a8.1 Avantages and Problems▼c27922▼a8.2 Preparation▼c28233▼a8.3 Nucleic Acids▼c28744▼a8.4 Proteins▼c29655▼a8.5 Biological Menbranes▼c30166▼a8.6 Imaging Cells and Other Applications▼c30277▼a8.7 Force Spectrum Analysis of Biologcal Materals▼c30688▼a9. Surface Modification▼c30999▼a9.1 Overview▼c30900▼a9.2 Direct Indentation with the Tunneling Tip▼c31011▼a9.3 Nanolithography on Resist Films▼c32122▼a9.4 Nanofabrication inSolution and in Gaseous Environments▼c32433▼a9.5 Atomic-Scale Manipulation▼c32744▼a9.6 Quantization of Conductance in Nano-Contacts Rroduced bt STM▼c33855▼a9.7 Fabrication With Other scanning-Probe Microscopes▼c33966▼a9.8 The Future▼c34377▼aReferences▼c34588▼aSubject Index▼c36799
■950 ▼b￦92830
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