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Bringing Scanning Probe Microscopy Up to Speed
Bringing Scanning Probe Microscopy Up to Speed
Detailed Information
- 자료유형
- 단행본
- ISBN
- 0-7923-8466-0
- UDC
- 53.082.7
- DDC
- 681.2 S999b-23
- 청구기호
- 681.2 S999b
- 서명/저자
- Bringing Scanning Probe Microscopy Up to Speed / S.C.Minne, S.R.Manalis, C.F.Quate 공저.
- 발행사항
- 미국 : Kluwer Academic Pub., 1999
- 형태사항
- 173p. ; 25cm
- 내용주기
- 완전내용CHAPTER 1 Improving Conventonal Scanning Probe Microscopes부분내용15완전내용Introduction부분내용15완전내용The Piezoresistive Cantilever부분내용17완전내용Imaging with Parallel Cantilevers부분내용20완전내용CHAPTER 2 Design of Piezoresistive Cantilevers with Integrated Actuators부분내용23완전내용Introduction부분내용23완전내용The ZnO / Piezoresistive Cantilever부분내용25완전내용Theory of Operation부분내용28완전내용Centroid and Moment of Ineria부분내용30완전내용Spring Constant부분내용3400완전내용Maximum Induced Deflection부분내용3911완전내용Minimum Detectable Deflection부분내용4222완전내용Actuator-Sensor Coupling부분내용4533완전내용Comparison to other Analyses부분내용4644완전내용Summary부분내용4755완전내용CHAPTER 3 Increasing the Speed of Imaging부분내용4966완전내용Introduction부분내용4977완전내용Parallel Cantilevers Operating Under Individual Feedback Control부분내용5188완전내용High Speed Imaging using the Piezoresistive Sensor부분내용5799완전내용Imaging using the ZnO as the Sensor부분내용6300완전내용High Speed Imaging with the Opical Lever Sensor Dynamic Imaging Modes부분내용7611완전내용CHAPTER 4 Cantilevers with Interdigital Deflection Sensors부분내용8122완전내용Introduction부분내용8133완전내용Theory of Operation부분내용8244완전내용Optical Simulations부분내용8855완전내용Minimum Detectable Deflection부분내용9466완전내용CHAPTER 5 Operation of the Interdigital Cantilever부분내용9977완전내용Microscope Description부분내용9988완전내용Imaging부분내용10299완전내용Biasing부분내용10400완전내용Resolution and Frequency Response부분내용10711완전내용Interdigital Cantilever Arrays부분내용11022완전내용Summary부분내용11733완전내용CHAPTER 6 Cantilever Arrays부분내용11944완전내용Automated, parallel, high-speed AFM부분내용11955완전내용Centimeter scale AFM부분내용12766완전내용CHAPTER 7 Scanning Probes for Information Storage and Retrieval부분내용13177완전내용Introduction부분내용13188완전내용Submicron recording with thin-film magnetic scanning probes부분내용13399완전내용CHAPTER 8 Silicon Process Flow: ZnO actuator and piezoresistive sensor부분내용14100완전내용Introduction부분내용14111완전내용Process Flow부분내용14122완전내용CHAPTER 9 Silicon Process Flow : Interdigital Cantilever부분내용15933완전내용Fabrication Process부분내용15944
- 가격
- ￦103630
- Control Number
- gtec:8286
MARC
008021021s1999 us 000a eng■020 ▼a0-7923-8466-0
■0801 ▼a53.082.7
■082 ▼a681.2▼bS999b▼223
■090 ▼a681.2▼bS999b
■1000 ▼aC.F.Quate, S.C.Minne, S.R.Manalis,
■24510▼aBringing Scanning Probe Microscopy Up to Speed▼dS.C.Minne, S.R.Manalis, C.F.Quate 공저.
■260 ▼a미국▼bKluwer Academic Pub.▼c1999
■300 ▼a173p.▼c25cm
■505 ▼aCHAPTER 1 Improving Conventonal Scanning Probe Microscopes▼c15▼aIntroduction▼c15▼aThe Piezoresistive Cantilever▼c17▼aImaging with Parallel Cantilevers▼c20▼aCHAPTER 2 Design of Piezoresistive Cantilevers with Integrated Actuators▼c23▼aIntroduction▼c23▼aThe ZnO / Piezoresistive Cantilever▼c25▼aTheory of Operation▼c28▼aCentroid and Moment of Ineria▼c30▼aSpring Constant▼c3400▼aMaximum Induced Deflection▼c3911▼aMinimum Detectable Deflection▼c4222▼aActuator-Sensor Coupling▼c4533▼aComparison to other Analyses▼c4644▼aSummary▼c4755▼aCHAPTER 3 Increasing the Speed of Imaging▼c4966▼aIntroduction▼c4977▼aParallel Cantilevers Operating Under Individual Feedback Control▼c5188▼aHigh Speed Imaging using the Piezoresistive Sensor▼c5799▼aImaging using the ZnO as the Sensor▼c6300▼aHigh Speed Imaging with the Opical Lever Sensor Dynamic Imaging Modes▼c7611▼aCHAPTER 4 Cantilevers with Interdigital Deflection Sensors▼c8122▼aIntroduction▼c8133▼aTheory of Operation▼c8244▼aOptical Simulations▼c8855▼aMinimum Detectable Deflection▼c9466▼aCHAPTER 5 Operation of the Interdigital Cantilever▼c9977▼aMicroscope Description▼c9988▼aImaging▼c10299▼aBiasing▼c10400▼aResolution and Frequency Response▼c10711▼aInterdigital Cantilever Arrays▼c11022▼aSummary▼c11733▼aCHAPTER 6 Cantilever Arrays▼c11944▼aAutomated, parallel, high-speed AFM▼c11955▼aCentimeter scale AFM▼c12766▼aCHAPTER 7 Scanning Probes for Information Storage and Retrieval▼c13177▼aIntroduction▼c13188▼aSubmicron recording with thin-film magnetic scanning probes▼c13399▼aCHAPTER 8 Silicon Process Flow: ZnO actuator and piezoresistive sensor▼c14100▼aIntroduction▼c14111▼aProcess Flow▼c14122▼aCHAPTER 9 Silicon Process Flow : Interdigital Cantilever▼c15933▼aFabrication Process▼c15944
■950 ▼b￦103630
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