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Precision Surface Metrology
Precision Surface Metrology
상세정보
- 자료유형
- 단행본
- UDC
- 53.082.5
- DDC
- 681.2 W974P-23
- 청구기호
- 681.2 W974p
- 저자명
- James C. Wyant
- 서명/저자
- Precision Surface Metrology / James C. Wyant
- 발행사항
- 미국 : SPIE, 1983
- 형태사항
- 207p. ; 28cm.
- 총서명
- Proceedings of SPIE-The International Society for Optical Engineering ; 429
- 내용주기
- 완전내용ELECTRONIC PHASE MEASUREMENT INTERFEROMETER부분내용1완전내용SURFACE ROUGHNESS MEASUREMENTS부분내용55완전내용SURFACE CONTOUR MEASUREMENTS부분내용113완전내용ANALYSIS TECHNIQUES부분내용165
- 키워드
- Measurements
- 가격
- ＄35
- Control Number
- gtec:5381
MARC
008990920s1983 us 0a eng■0801 ▼a53.082.5
■082 ▼a681.2▼bW974P▼223
■090 ▼a681.2▼bW974p
■1000 ▼aJames C. Wyant
■24510▼aPrecision Surface Metrology▼dJames C. Wyant
■260 ▼a미국▼bSPIE▼c1983
■300 ▼a207p.▼c28cm.
■44000▼aProceedings of SPIE-The International Society for Optical Engineering▼v429
■505 ▼aELECTRONIC PHASE MEASUREMENT INTERFEROMETER▼c1▼aSURFACE ROUGHNESS MEASUREMENTS▼c55▼aSURFACE CONTOUR MEASUREMENTS▼c113▼aANALYSIS TECHNIQUES▼c165
■653 ▼aMeasurements
■950 ▼b＄35
