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Integrated circuit failure analysis - [electronic resource] : a guide to preparation techniques : Friedrich Beck ; translated by Stephen S. Wilson.
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Integrated circuit failure analysis - [electronic resource] : a guide to preparation techniques : Friedrich Beck ; translated by Stephen S. Wilson.
상세정보
- 자료유형
- 비도서
- ISBN
- 0585269467 (electronic bk.)
- 언어부호
- 본문언어 - eng, 원저작언어 - ger
- 미국회청구기호
- TK7871.852-.B43 1997eb
- DDC
- 621.3815-21
- 저자명
- Beck, Friedrich.
- 통일서명
- Pr?parationstechniken f?r die Fehleranalyse an integrierten Halbleiterschaltungen.. English
- 서명/저자
- Integrated circuit failure analysis - [electronic resource] : a guide to preparation techniques : Friedrich Beck ; translated by Stephen S. Wilson.
- 발행사항
- Chichester : Wiley, c1998.
- 형태사항
- xiv, 173 p. : ill. ; 24 cm.
- 총서명
- Wiley series in quality and reliability engineering
- 서지주기
- Includes bibliographical references and index.
- 복제주기
- Electronic reproduction. . Boulder, Colo. : NetLibrary, 2000. Available via World Wide Web. Access may be limited to NetLibrary affiliated libraries.
- 일반주제명
- Semiconductors Failures. Semiconductors Testing. Semiconducteurs D?faillances. Semiconducteurs Essais.
- 기타저자
- NetLibrary, Inc.
- 기타형태저록
- . Original. 0471974013. (DLC) 97011255. (OCoLC)36510050
- 전자적 위치 및 접속
- . Original. 0471974013. (DLC) 97011255. (OCoLC)36510050
- Control Number
- gtec:46513
MARC
008001009s1998 enka sb 001 0 eng d■003 OCoLC
■020 ▼a0585269467 (electronic bk.)
■040 ▼aN▼T▼cN▼T▼dOCL▼dOCLCQ▼dMUQ▼dOCLCQ
■0411 ▼aeng▼hger
■05014▼aTK7871.852▼b.B43 1997eb
■08204▼a621.3815▼221
■090 ▼a ▼b
■1001 ▼aBeck, Friedrich.
■24010▼aPr?parationstechniken f?r die Fehleranalyse an integrierten Halbleiterschaltungen.▼lEnglish
■24510▼aIntegrated circuit failure analysis▼h[electronic resource] ▼ba guide to preparation techniques ▼cFriedrich Beck ; translated by Stephen S. Wilson.
■260 ▼aChichester ▼aNew York ▼bWiley▼cc1998.
■300 ▼axiv, 173 p. ▼bill. ▼c24 cm.
■4400 ▼aWiley series in quality and reliability engineering
■504 ▼aIncludes bibliographical references and index.
■533 ▼aElectronic reproduction.▼bBoulder, Colo. ▼cNetLibrary▼d2000.▼nAvailable via World Wide Web.▼nAccess may be limited to NetLibrary affiliated libraries.
■6500 ▼aSemiconductors▼xFailures.▼aSemiconductors▼xTesting.▼aSemiconducteurs▼xD?faillances.▼aSemiconducteurs▼xEssais.
■6557 ▼aElectronic books.▼2local
■7102 ▼aNetLibrary, Inc.
■7761 ▼cOriginal▼z0471974013▼w(DLC) 97011255▼w(OCoLC)36510050
■8564 ▼3Bibliographic record display▼uhttp://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=25987▼zAn electronic book accessible through the World Wide Web;click for information
■994 ▼aX0▼bKER
