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Neural Models and Algorithms for Digital Testing
![Neural Models and Algorithms for Digital Testing / [by] S.T.Chakradhar, V.D.Agrawal, M.L.B...](/Sponge/Images/bookDefaults/MMbookdefaultsmall.png)
Neural Models and Algorithms for Digital Testing
상세정보
- 자료유형
- 단행본
- UDC
- 681.326.7
- DDC
- 600-23
- 청구기호
- 600 C 435 m
- 서명/저자
- Neural Models and Algorithms for Digital Testing / [by] S.T.Chakradhar, V.D.Agrawal, M.L.Bushnell.
- 발행사항
- London : Kluwer Academic Pub., 1991
- 형태사항
- 184 : illus. ; 23
- 주기사항
- Logic circuits Automatic checkout equipment Digital integrated circuits
- Control Number
- gtec:4573
MARC
008961218s1991 us 000 eng■0801 ▼a681.326.7
■082 ▼a600▼223
■090 ▼a600▼bC 435 m
■1001 ▼a[by] S.T.Chakradhar, V.D.Agrawal, M.L.Bushnell.
■24510▼aNeural Models and Algorithms for Digital Testing▼d[by] S.T.Chakradhar, V.D.Agrawal, M.L.Bushnell.
■260 ▼aLondon▼bKluwer Academic Pub.▼c1991
■300 ▼a184▼billus.▼c23
■500 ▼aLogic circuits Automatic checkout equipment Digital integrated circuits▼a등록번호 H4630 : 서고에 보관 (종합자료실 데스크에 문의)
