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Neural Models and Algorithms for Digital Testing
Neural Models and Algorithms for Digital Testing / [by] S.T.Chakradhar, V.D.Agrawal, M.L.B...
Neural Models and Algorithms for Digital Testing

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자료유형  
 단행본
UDC  
681.326.7
DDC  
600-23
청구기호  
600 C 435 m
저자명  
[by] S.T.Chakradhar, V.D.Agrawal, M.L.Bushnell.
서명/저자  
Neural Models and Algorithms for Digital Testing / [by] S.T.Chakradhar, V.D.Agrawal, M.L.Bushnell.
발행사항  
London : Kluwer Academic Pub., 1991
형태사항  
184 : illus. ; 23
주기사항  
Logic circuits Automatic checkout equipment Digital integrated circuits
Control Number  
gtec:4573

MARC

 008961218s1991        us                        000      eng
■0801  ▼a681.326.7
■082    ▼a600▼223
■090    ▼a600▼bC  435  m
■1001  ▼a[by]  S.T.Chakradhar,  V.D.Agrawal,  M.L.Bushnell.
■24510▼aNeural  Models  and  Algorithms  for  Digital  Testing▼d[by]  S.T.Chakradhar,  V.D.Agrawal,  M.L.Bushnell.
■260    ▼aLondon▼bKluwer  Academic  Pub.▼c1991
■300    ▼a184▼billus.▼c23
■500    ▼aLogic  circuits  Automatic  checkout  equipment  Digital  integrated  circuits▼a등록번호  H4630  :  서고에  보관  (종합자료실  데스크에  문의)

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