본문

서브메뉴

검색

  1. Home
Neural Models and Algorithms for Digital Testing
Neural Models and Algorithms for Digital Testing / [by] S.T.Chakradhar, V.D.Agrawal, M.L.B...
Neural Models and Algorithms for Digital Testing

Detailed Information

자료유형  
 단행본
UDC  
681.326.7
DDC  
600-23
청구기호  
600 C 435 m
저자명  
[by] S.T.Chakradhar, V.D.Agrawal, M.L.Bushnell.
서명/저자  
Neural Models and Algorithms for Digital Testing / [by] S.T.Chakradhar, V.D.Agrawal, M.L.Bushnell.
발행사항  
London : Kluwer Academic Pub., 1991
형태사항  
184 : illus. ; 23
주기사항  
Logic circuits Automatic checkout equipment Digital integrated circuits
Control Number  
gtec:4573

MARC

 008961218s1991        us                        000      eng
■0801  ▼a681.326.7
■082    ▼a600▼223
■090    ▼a600▼bC  435  m
■1001  ▼a[by]  S.T.Chakradhar,  V.D.Agrawal,  M.L.Bushnell.
■24510▼aNeural  Models  and  Algorithms  for  Digital  Testing▼d[by]  S.T.Chakradhar,  V.D.Agrawal,  M.L.Bushnell.
■260    ▼aLondon▼bKluwer  Academic  Pub.▼c1991
■300    ▼a184▼billus.▼c23
■500    ▼aLogic  circuits  Automatic  checkout  equipment  Digital  integrated  circuits▼a등록번호  H4630  :  서고에  보관  (종합자료실  데스크에  문의)

Preview

Export

ChatGPT Discussion

AI Recommended Related Books


    New Books MORE
    Related books MORE
    Statistics for the past 3 years. Go to brief
    Recommend

    ค้นหาข้อมูลรายละเอียด

    • จองห้องพัก
    • Book Loan Request Service
    • โฟลเดอร์ของฉัน
    วัสดุ
    Reg No. Call No. ตำแหน่งที่ตั้ง สถานะ ยืมข้อมูล
    H004630 600 C 435 m 서고(데스크 문의) 대출가능 대출가능
    대출신청 My Folder

    * จองมีอยู่ในหนังสือยืม เพื่อให้การสำรองที่นั่งคลิกที่ปุ่มจองห้องพัก

    Books borrowed together with this book

    Related books

    Related Popular Books

    도서위치

    * 자료 이용 안내 *
    '서고'에 소장중인 자료의 열람(또는 대출)을 희망할 경우, 종합자료실 데스크로 문의바랍니다.