서브메뉴
검색
Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages
Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages
Detailed Information
- 자료유형
- 기사
- ISSN
- 12298557
- 서명/저자
- Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages / ・Jae-Yeo! Kim, Sung-Un Yoon and Chang-H四nKim
- 형태사항
- pp. 11
- 모체레코드
- 모체정보확인
- Control Number
- gtec:383927
MARC
008171218s2004 aa kor■022 ▼a12298557
■245 ▼aDevelopment and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages▼d・Jae-Yeo! Kim, Sung-Un Yoon and Chang-H四nKim
■300 ▼app. 11
■7001 ▼a・Jae-Yeo! Kim, Sung-Un Yoon and Chang-H四nKim
■773 ▼tInternational Journal of Precision Engineering and Manufacturing▼gv.5 n.3▼d2004, 07
■SIS ▼aKS012158▼b63235▼h1▼sG
Preview
Export
ChatGPT Discussion
AI Recommended Related Books
Info Détail de la recherche.
- Réservation
- Book Loan Request Service
- My Folder
