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Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages
Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconducto...
Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages

Detailed Information

자료유형  
 기사
ISSN  
12298557
서명/저자  
Development and Characterization ofPattem Recognition Algorithm for Defects m Semiconductor Packages / ・Jae-Yeo! Kim, Sung-Un Yoon and Chang-H四nKim
형태사항  
pp. 11
기타저자  
・Jae-Yeo! Kim, Sung-Un Yoon and Chang-H四nKim
기본자료저록  
International Journal of Precision Engineering and Manufacturing : v.5 n.3 2004, 07
모체레코드  
모체정보확인
Control Number  
gtec:383927

MARC

 008171218s2004                                        aa    kor
■022    ▼a12298557
■245    ▼aDevelopment  and  Characterization  ofPattem  Recognition  Algorithm  for  Defects  m  Semiconductor  Packages▼d・Jae-Yeo!  Kim,  Sung-Un  Yoon  and  Chang-H四nKim
■300    ▼app.  11
■7001  ▼a・Jae-Yeo!  Kim,  Sung-Un  Yoon  and  Chang-H四nKim
■773    ▼tInternational  Journal  of  Precision  Engineering  and  Manufacturing▼gv.5  n.3▼d2004,  07
■SIS    ▼aKS012158▼b63235▼h1▼sG

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