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Report of ``Robustness validation of semiconductor device in automotive application''
Report of ``Robustness validation of semiconductor device in automotive application''
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MARC
008171206s2009 aa jpn■022 ▼a03857298
■245 ▼aReport of ``Robustness validation of semiconductor device in automotive application''▼dGoto, M.
■300 ▼app. 94
■7001 ▼aGoto, M.
■773 ▼t自動車技術=Journal of Society of Automotive Engineers of Japan : 자동차기술▼gv.63 n.3▼d2009, 03
■SIS ▼aKS020029▼b63242▼h1▼sG
