본문

서브메뉴

검색

  1. Home
Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope
Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field ...
Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope

Detailed Information

Material Type  
 기사
ISSN  
10871357
Title/Author  
Construction and Analysis of Nanoscale Simulative Measuring Model for Scanning Near-Field Optical Microscope / Lin, Z.-C
Added Entry-Personal Name  
Lin, Z.-C
Host Item Entry  
Journal of Manufacturing Science and Engineering : v.132 n.3 2010, 06
모체레코드  
모체정보확인
Control Number  
gtec:345982

MARC

 008171013s2010              a    a                          eng
■022    ▼a10871357
■245    ▼aConstruction  and  Analysis  of  Nanoscale  Simulative  Measuring  Model  for  Scanning  Near-Field  Optical  Microscope▼dLin,  Z.-C
■7001  ▼aLin,  Z.-C
■773    ▼tJournal  of  Manufacturing  Science  and  Engineering▼gv.132  n.3▼d2010,  06
■SIS    ▼aKS022699▼b63162▼h3▼sG

Preview

Export

ChatGPT Discussion

AI Recommended Related Books


    New Books MORE
    Related books MORE
    Statistics for the past 3 years. Go to brief
    Recommend

    Detail Info.

    • Reservation
    • Book Loan Request Service
    • My Folder
    Material
    Reg No. Call No. Location Status Lend Info
    AR28644 종합자료실 대출가능 대출가능
    대출신청 My Folder

    * Reservations are available in the borrowing book. To make reservations, Please click the reservation button

    Books borrowed together with this book

    Related books

    Related Popular Books

    도서위치