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Automatic Sample Alignment Under Microscopy for 360° Imaging Based on the Nanorobotic Manipulation System
Automatic Sample Alignment Under Microscopy for 360° Imaging Based on the Nanorobotic Man...
Automatic Sample Alignment Under Microscopy for 360° Imaging Based on the Nanorobotic Manipulation System

Detailed Information

자료유형  
 기사
ISSN  
15523098
서명/저자  
Automatic Sample Alignment Under Microscopy for 360° Imaging Based on the Nanorobotic Manipulation System / Shen, Y. ; Wan, W. ; Lu, H.
형태사항  
pp. 220
기타저자  
Shen, Y.
기타저자  
Wan, W.
기타저자  
Lu, H.
기본자료저록  
IEEE Transactions on Robotics : v.33 n.1 2017, 02
모체레코드  
모체정보확인
Control Number  
gtec:340071

MARC

 008170927s2017              a    a                          eng
■022    ▼a15523098
■245    ▼aAutomatic  Sample  Alignment  Under  Microscopy  for  360°  Imaging  Based  on  the  Nanorobotic  Manipulation  System▼dShen,  Y.▼eWan,  W.▼eLu,  H.
■300    ▼app.  220
■7001  ▼aShen,  Y.
■7001  ▼aWan,  W.
■7001  ▼aLu,  H.
■773    ▼tIEEE  Transactions  on  Robotics▼gv.33  n.1▼d2017,  02
■SIS    ▼aKS033869▼b63154▼h3▼sG

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