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Thickness Dependent Study of RF Sputtered ZnO Thin Films for Oproelectronic Device Applications
Thickness Dependent Study of RF Sputtered ZnO Thin Films for Oproelectronic Device Applications
Detailed Information
- 자료유형
- 기사
- ISSN
- 17388090
- 서명/저자
- Thickness Dependent Study of RF Sputtered ZnO Thin Films for Oproelectronic Device Applications / Shashikant Sharma ; C.Periasamy, P.Chakrabarti
- 형태사항
- pp. 1093
- 기타저자
- Shashikant Sharma
- 모체레코드
- 모체정보확인
- Control Number
- gtec:294426
MARC
008151124s2015 a a eng■022 ▼a17388090
■245 ▼aThickness Dependent Study of RF Sputtered ZnO Thin Films for Oproelectronic Device Applications▼dShashikant Sharma▼eC.Periasamy, P.Chakrabarti
■300 ▼app. 1093
■7001 ▼aShashikant Sharma
■7001 ▼aC.Periasamy, P.Chakrabarti
■773 ▼tElectronic Materials Letters▼gv.11 n.6▼d2015, 11
■SIS ▼aKS031443▼b63247▼h3▼sG
