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Stability Study of Solution-Processed Zinc Tin Oxide Thin-Flim Transistors
Stability Study of Solution-Processed Zinc Tin Oxide Thin-Flim Transistors
Detailed Information
- Material Type
- 기사
- ISSN
- 17388090
- Title/Author
- Stability Study of Solution-Processed Zinc Tin Oxide Thin-Flim Transistors / Xue Zhang ; Jean Pierre Ndabakuranye, Dong Wook Kim
- Material Info
- pp. 964
- Added Entry-Personal Name
- Xue Zhang
- Added Entry-Personal Name
- Jean Pierre Ndabakuranye, Dong Wook Kim
- Host Item Entry
- Electronic Materials Letters : v.11 n.6 2015, 11
- 모체레코드
- 모체정보확인
- Control Number
- gtec:294408
MARC
008151124s2015 a a eng■022 ▼a17388090
■245 ▼aStability Study of Solution-Processed Zinc Tin Oxide Thin-Flim Transistors▼dXue Zhang▼eJean Pierre Ndabakuranye, Dong Wook Kim
■300 ▼app. 964
■7001 ▼aXue Zhang
■7001 ▼aJean Pierre Ndabakuranye, Dong Wook Kim
■773 ▼tElectronic Materials Letters▼gv.11 n.6▼d2015, 11
■SIS ▼aKS031443▼b63247▼h3▼sG
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