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Stability Study of Solution-Processed Zinc Tin Oxide Thin-Flim Transistors
Stability Study of Solution-Processed Zinc Tin Oxide Thin-Flim Transistors / Xue Zhang ; J...
Stability Study of Solution-Processed Zinc Tin Oxide Thin-Flim Transistors

Detailed Information

자료유형  
 기사
ISSN  
17388090
서명/저자  
Stability Study of Solution-Processed Zinc Tin Oxide Thin-Flim Transistors / Xue Zhang ; Jean Pierre Ndabakuranye, Dong Wook Kim
형태사항  
pp. 964
기타저자  
Xue Zhang
기타저자  
Jean Pierre Ndabakuranye, Dong Wook Kim
기본자료저록  
Electronic Materials Letters : v.11 n.6 2015, 11
모체레코드  
모체정보확인
Control Number  
gtec:294408

MARC

 008151124s2015              a    a                          eng
■022    ▼a17388090
■245    ▼aStability  Study  of  Solution-Processed  Zinc  Tin  Oxide  Thin-Flim  Transistors▼dXue  Zhang▼eJean  Pierre  Ndabakuranye,  Dong  Wook  Kim
■300    ▼app.  964
■7001  ▼aXue  Zhang
■7001  ▼aJean  Pierre  Ndabakuranye,  Dong  Wook  Kim
■773    ▼tElectronic  Materials  Letters▼gv.11  n.6▼d2015,  11
■SIS    ▼aKS031443▼b63247▼h3▼sG

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